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"Characterization and Modeling of SET Generation Effects in CMOS Standard ..."

Marko S. Andjelkovic et al. (2019)

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DOI: 10.1109/IOLTS.2019.8854379

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-05

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  - conf/iolts/AndjelkovicLSKK19
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Marko S. Andjelkovic, Yuanqing Li, Zoran Stamenkovic, Milos Krstic, Rolf Kraemer:
Characterization and Modeling of SET Generation Effects in CMOS Standard Logic Cells. IOLTS 2019: 212-215

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