"A Comprehensive Oxide-Based ReRAM TCAD Model with Experimental Verification."

Wolfgang Goes et al. (2021)

> Home

Details and statistics

DOI: 10.1109/IMW51353.2021.9439623

access: closed

type: Conference or Workshop Paper

metadata version: 2023-07-13

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/imw2/GoesGBPBRMN21
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/imw2/GoesGBPBRMN21
Wolfgang Goes, D. Green, Philippe Blaise, Giuseppe Piccolboni, Alessandro Bricalli, Amir Regev, Gabriel Molas, Jean-Francois Nodin:
A Comprehensive Oxide-Based ReRAM TCAD Model with Experimental Verification. IMW 2021: 1-4

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.