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"Device Characterization Using Variable Rectilinear Interpolation."

C. T. Yeung, Bob Lin (1997)

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DOI: 10.2352/CIC.1997.5.1.ART00038

access: open

type: Conference or Workshop Paper

metadata version: 2023-07-15

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  dblp key:
  - conf/imaging/YeungL97
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  - https://dblp.org/rec/conf/imaging/YeungL97
C. T. Yeung, Bob Lin:
Device Characterization Using Variable Rectilinear Interpolation. CIC 1997: 193-196

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