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"Neural Network Inverse Model for Quality Monitoring - Application to a ..."

Philippe Thomas et al. (2017)

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DOI: 10.5220/0006485901860191

access: closed

type: Conference or Workshop Paper

metadata version: 2018-08-23

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  dblp key:
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Philippe Thomas, Marie-Christine Suhner, Emmanuel Zimmermann, Hind Bril El Haouzi, André Thomas, Mélanie Noyel:
Neural Network Inverse Model for Quality Monitoring - Application to a High Quality Lackering Process. IJCCI 2017: 186-191

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