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"A Machine Learning Approach for Effective Software Defect Detection."

Maria Vasileiou, George Papageorgiou, Christos Tjortjis (2023)

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DOI: 10.1109/IISA59645.2023.10345866

access: closed

type: Conference or Workshop Paper

metadata version: 2024-01-26

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Maria Vasileiou, George Papageorgiou, Christos Tjortjis:
A Machine Learning Approach for Effective Software Defect Detection. IISA 2023: 1-8

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