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"A Measuring Device for Studying Scaling of Emissivities from Sub-pixel to ..."

Renhua Zhang et al. (2006)

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DOI: 10.1109/IGARSS.2006.532

access: closed

type: Conference or Workshop Paper

metadata version: 2019-09-25

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Renhua Zhang, Jing Tian, Hongbo Su, Xiao-Ming Sun, Zhao-Liang Li, Zhilin Zhu:
A Measuring Device for Studying Scaling of Emissivities from Sub-pixel to Pixel. IGARSS 2006: 2056-2059

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