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"A comparison between leaf dielectric properties of stressed and unstressed ..."

Tim van Emmerik et al. (2015)

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DOI: 10.1109/IGARSS.2015.7325753

access: closed

type: Conference or Workshop Paper

metadata version: 2019-06-02

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  - conf/igarss/EmmerikSJG15
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  - https://dblp.org/rec/conf/igarss/EmmerikSJG15
Tim van Emmerik, Susan C. Steele-Dunne, Jasmeet Judge, Nick van de Giesen:
A comparison between leaf dielectric properties of stressed and unstressed tomato plants. IGARSS 2015: 275-278

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