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"Enabling an AI-Based Defect Detection Approach to Facilitate Zero Defect ..."

Nicolas Leberruyer et al. (2023)

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DOI: 10.1007/978-3-031-43666-6_43

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-24

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  dblp key:
  - conf/ifip5-7/LeberruyerBAA23
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  - https://dblp.org/rec/conf/ifip5-7/LeberruyerBAA23
Nicolas Leberruyer, Jessica Bruch, Mats Ahlskog, Sara Afshar:
Enabling an AI-Based Defect Detection Approach to Facilitate Zero Defect Manufacturing. APMS (2) 2023: 634-649

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