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"Construct an Intelligent Yield Alert and Diagnostic Analysis System via ..."

Yi-Jyun Chen, Yen-Han Lee, Ming-Chuan Chiu (2018)

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DOI: 10.1007/978-3-319-99707-0_49

access: closed

type: Conference or Workshop Paper

metadata version: 2018-08-27

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  - conf/ifip5-7/ChenLC18
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Yi-Jyun Chen, Yen-Han Lee, Ming-Chuan Chiu:
Construct an Intelligent Yield Alert and Diagnostic Analysis System via Data Analysis: Empirical Study of a Semiconductor Foundry. APMS (2) 2018: 394-401

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