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"Fault Diagnosis and Knowledge Extraction Using Fast Logical Analysis of ..."

Xiwei Bai, Jie Tan, Xuelei Wang (2018)

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DOI: 10.1007/978-3-030-01313-4_44

access: closed

type: Conference or Workshop Paper

metadata version: 2018-12-10

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  dblp key:
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Xiwei Bai, Jie Tan, Xuelei Wang:
Fault Diagnosis and Knowledge Extraction Using Fast Logical Analysis of Data with Multiple Rules Discovery Ability. IFIP TC12 ICIS 2018: 412-421

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