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"Formal proof and test case generation for critical embedded systems using ..."

Guy Durrieu et al. (2004)

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DOI: 10.1007/978-1-4020-8157-6_44

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-19

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Guy Durrieu, Odile Laurent, Christel Seguin, Virginie Wiels:
Formal proof and test case generation for critical embedded systems using SCADE. IFIP Congress Topical Sessions 2004: 499-504

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