"Wafer Map Defect Recognition Based on Deep Transfer Learning."

Zongli Shen, Jianbo Yu (2019)

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DOI: 10.1109/IEEM44572.2019.8978568

access: closed

type: Conference or Workshop Paper

metadata version: 2021-07-25

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Zongli Shen, Jianbo Yu:
Wafer Map Defect Recognition Based on Deep Transfer Learning. IEEM 2019: 1568-1572

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