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"A Novel Manufacturing Defect Detection Method Using Data Mining Approach."

Wei-Chou Chen, Shian-Shyong Tseng, Ching-Yao Wang (2004)

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DOI: 10.1007/978-3-540-24677-0_9

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-19

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  dblp key:
  - conf/ieaaie/ChenTW04
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  - https://dblp.org/rec/conf/ieaaie/ChenTW04
Wei-Chou Chen, Shian-Shyong Tseng, Ching-Yao Wang:
A Novel Manufacturing Defect Detection Method Using Data Mining Approach. IEA/AIE 2004: 77-86

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