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"Multiple fault testing in systems-on-chip with high-level decision diagrams."
Raimund Ubar et al. (2015)
- Raimund Ubar
, Stephen Adeboye Oyeniran
, Mario Schölzel, Heinrich Theodor Vierhaus:
Multiple fault testing in systems-on-chip with high-level decision diagrams. IDT 2015: 66-71
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