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"A DFM tool for analyzing lithography and stress effects on standard cells ..."
Rami F. Salem et al. (2010)
- Rami F. Salem, Abdelrahman ElMously, Haitham Eissa, Mohamed Dessouky, Mohab H. Anis:
A DFM tool for analyzing lithography and stress effects on standard cells and critical path performance in 45nm digital designs. IDT 2010: 13-17
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