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"Single-ended sense amplifier robustness evaluation for OxRRAM technology."

Hassen Aziza et al. (2013)

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DOI: 10.1109/IDT.2013.6727097

access: closed

type: Conference or Workshop Paper

metadata version: 2022-12-07

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Hassen Aziza, Marc Bocquet, Mathieu Moreau, Jean-Michel Portal:
Single-ended sense amplifier robustness evaluation for OxRRAM technology. IDT 2013: 1-5

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