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"Soft-Event-Upset and Soft-Event-Transient Tolerant CMOS Circuit Design for ..."

I-Chyn Wey et al. (2019)

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DOI: 10.1109/ICUFN.2019.8806167

access: closed

type: Conference or Workshop Paper

metadata version: 2019-08-28

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  - conf/icufn/WeyCFC19
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I-Chyn Wey, Chun-Han Chen, Si-Zhan Fang, Heng-Jui Chou:
Soft-Event-Upset and Soft-Event-Transient Tolerant CMOS Circuit Design for Low-Voltage Low-Power Wireless IoT Applications. ICUFN 2019: 179-181

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