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"Design of a Fault Detection Circuit for One-Time Programmable Memories for ..."

Hye-Hyun Lee, Kang-Yoon Lee (2023)

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DOI: 10.1109/ICUFN57995.2023.10200013

access: closed

type: Conference or Workshop Paper

metadata version: 2023-08-17

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Hye-Hyun Lee, Kang-Yoon Lee:
Design of a Fault Detection Circuit for One-Time Programmable Memories for Reducing Time. ICUFN 2023: 894-897

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