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"Prediction of Key Metrics of Stacked Nanosheet nFETs using Genetic ..."
Haoqing Xu et al. (2022)
- Haoqing Xu, Weizhuo Gan, Lei Cao, Huaxiang Yin, Zhenhua Wu:
Prediction of Key Metrics of Stacked Nanosheet nFETs using Genetic Algorithm-based Neural Networks. ICTA 2022: 3-4
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