"XSTRESSOR : Automatic Generation of Large-Scale Worst-Case Test Inputs by ..."

Charitha Saumya et al. (2019)

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DOI: 10.1109/ICST.2019.00011

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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Charitha Saumya, Jinkyu Koo, Milind Kulkarni, Saurabh Bagchi:
XSTRESSOR : Automatic Generation of Large-Scale Worst-Case Test Inputs by Inferring Path Conditions. ICST 2019: 1-12

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