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"Automating Endurance Test for Flash-based Storage Devices in Samsung ..."

Jinkook Kim et al. (2023)

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DOI: 10.1109/ICST57152.2023.00037

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-01

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Jinkook Kim, Minseok Jeon, Sejeong Jang, Hakjoo Oh:
Automating Endurance Test for Flash-based Storage Devices in Samsung Electronics. ICST 2023: 317-326

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