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"Research on fault feature extraction for analog circuits."

Lihua Zhang et al. (2016)

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DOI: 10.1145/3015166.3015177

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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  dblp key:
  - conf/icsps/ZhangSQCZ16
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  - https://dblp.org/rec/conf/icsps/ZhangSQCZ16
Lihua Zhang, Yue Shang, Qi Qin, Shaowei Chen, Shuai Zhao:
Research on fault feature extraction for analog circuits. ICSPS 2016: 173-177

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