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"Impact of Defect Instances for Successful Deep Learning-based Automatic ..."

Misoo Kim et al. (2022)

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DOI: 10.1109/ICSME55016.2022.00051

access: closed

type: Conference or Workshop Paper

metadata version: 2023-08-08

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  dblp key:
  - conf/icsm/KimKHJKL22
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Misoo Kim, Youngkyoung Kim, Jinseok Heo, Hohyeon Jeong, Sungoh Kim, Eunseok Lee:
Impact of Defect Instances for Successful Deep Learning-based Automatic Program Repair. ICSME 2022: 419-423

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