BibTeX record conf/icsenst/KrohsF13

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@inproceedings{DBLP:conf/icsenst/KrohsF13,
  author    = {Florian Krohs and
               Sergej Fatikow},
  title     = {Novel high-resolution sidewall imaging using standard Atomic Force
               Microscopy equipment: Exceeding surface scanning using customized
               FIB-milled {AFM} tips in torsional feedback mode},
  booktitle = {Seventh International Conference on Sensing Technology, {ICST} 2013,
               Wellington, New Zealand, December 3-5, 2013},
  pages     = {608--611},
  publisher = {{IEEE}},
  year      = {2013},
  url       = {https://doi.org/10.1109/ICSensT.2013.6727725},
  doi       = {10.1109/ICSensT.2013.6727725},
  timestamp = {Fri, 17 Apr 2020 13:04:54 +0200},
  biburl    = {https://dblp.org/rec/conf/icsenst/KrohsF13.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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