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"Automated Test Input Generation for Android: Towards Getting There in an ..."

Haibing Zheng et al. (2017)

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DOI: 10.1109/ICSE-SEIP.2017.32

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/icse/ZhengLLZZDLYX17
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  persistent URL:
  - https://dblp.org/rec/conf/icse/ZhengLLZZDLYX17
Haibing Zheng, Dengfeng Li, Beihai Liang, Xia Zeng, Wujie Zheng, Yuetang Deng, Wing Lam, Wei Yang, Tao Xie:
Automated Test Input Generation for Android: Towards Getting There in an Industrial Case. ICSE-SEIP 2017: 253-262

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