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"The effect of program and model structure on mc/dc test adequacy coverage."

Ajitha Rajan, Michael W. Whalen, Mats Per Erik Heimdahl (2008)

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DOI: 10.1145/1368088.1368111

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Ajitha Rajan, Michael W. Whalen, Mats Per Erik Heimdahl:
The effect of program and model structure on mc/dc test adequacy coverage. ICSE 2008: 161-170

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