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"Surveying the Developer Experience of Flaky Tests."

Owain Parry et al. (2022)

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DOI: 10.1109/ICSE-SEIP55303.2022.9793965

access: closed

type: Conference or Workshop Paper

metadata version: 2022-06-28

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  dblp key:
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  - https://dblp.org/rec/conf/icse/ParryKHM22
Owain Parry, Gregory M. Kapfhammer, Michael Hilton, Phil McMinn:
Surveying the Developer Experience of Flaky Tests. ICSE (SEIP) 2022: 253-262

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