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"Flake It 'Till You Make It: Using Automated Repair to Induce and Fix ..."

Owain Parry et al. (2020)

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DOI: 10.1145/3387940.3392177

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-16

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  dblp key:
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Owain Parry, Gregory M. Kapfhammer, Michael Hilton, Phil McMinn:
Flake It 'Till You Make It: Using Automated Repair to Induce and Fix Latent Test Flakiness. ICSE (Workshops) 2020: 11-12

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