BibTeX record conf/icse/MuraliY0021

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@inproceedings{DBLP:conf/icse/MuraliY0021,
  author    = {Vijayaraghavan Murali and
               Edward Yao and
               Umang Mathur and
               Satish Chandra},
  title     = {Scalable Statistical Root Cause Analysis on App Telemetry},
  booktitle = {43rd {IEEE/ACM} International Conference on Software Engineering:
               Software Engineering in Practice, {ICSE} {(SEIP)} 2021, Madrid, Spain,
               May 25-28, 2021},
  pages     = {288--297},
  publisher = {{IEEE}},
  year      = {2021},
  url       = {https://doi.org/10.1109/ICSE-SEIP52600.2021.00038},
  doi       = {10.1109/ICSE-SEIP52600.2021.00038},
  timestamp = {Sun, 25 Jul 2021 11:48:45 +0200},
  biburl    = {https://dblp.org/rec/conf/icse/MuraliY0021.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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