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"A defects detection system for the surfaces of stampings."

Baowen Chen et al. (2013)

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DOI: 10.1117/12.2049795

access: closed

type: Conference or Workshop Paper

metadata version: 2022-06-30

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  dblp key:
  - conf/icmv/ChenJ0S13
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Baowen Chen, Jun Jiang, Jun Cheng, Sanming Shen:
A defects detection system for the surfaces of stampings. ICMV 2013: 906708

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