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"General Model for Manufacturing Defect Detection Crossing Multiple Products."

Longfei Zhou et al. (2023)

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DOI: 10.1109/ICMLA58977.2023.00241

access: closed

type: Conference or Workshop Paper

metadata version: 2024-04-12

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  dblp key:
  - conf/icmla/ZhouQXLCLYLLSHH23
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  persistent URL:
  - https://dblp.org/rec/conf/icmla/ZhouQXLCLYLLSHH23
Longfei Zhou, Zhanghao Qin, Ping Xia, Jiabao Liu, Weihao Cheng, Yunwei Li, Leyi Ying, Qian Liu, Mengxin Liu, Gezhang Song, Zebo Huang, Zhou Hao:
General Model for Manufacturing Defect Detection Crossing Multiple Products. ICMLA 2023: 1595-1600

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