"A new cluster-based feature extraction method for surface defect detection."

Gang Yu, Sagar V. Kamarthi, Stefan Pittner (2004)

Details and statistics

DOI: 10.1109/ICMLA.2004.1383499

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-19

a service of  Schloss Dagstuhl - Leibniz Center for Informatics