"MEMS Spring Probe for Next Generation Wafer Level Testing."

Kee-Keun Lee, Bruce C. Kim (2003)

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DOI: 10.1109/ICMENS.2003.1221994

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Kee-Keun Lee, Bruce C. Kim:
MEMS Spring Probe for Next Generation Wafer Level Testing. ICMENS 2003: 214-217

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