"Feasibility of Nano Electrical Resistive Tomography for Subsurface Atomic ..."

Benjamin J. Stanwell, Yuen Kuan Yong, Andrew J. Fleming (2025)

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DOI: 10.1109/ICM62621.2025.10934851

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type: Conference or Workshop Paper

metadata version: 2025-05-06

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Benjamin J. Stanwell, Yuen Kuan Yong, Andrew J. Fleming:
Feasibility of Nano Electrical Resistive Tomography for Subsurface Atomic Force Microscopy. ICM 2025: 1-6

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