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"Wideband spectrum sensing technique based on Goodness-of-Fit testing."

Bart Scheers, Djamel Teguig, Vincent Le Nir (2015)

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DOI: 10.1109/ICMCIS.2015.7158719

access: closed

type: Conference or Workshop Paper

metadata version: 2024-04-27

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  dblp key:
  - conf/icmcis/ScheersTN15
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  - https://dblp.org/rec/conf/icmcis/ScheersTN15
Bart Scheers, Djamel Teguig, Vincent Le Nir:
Wideband spectrum sensing technique based on Goodness-of-Fit testing. ICMCIS 2015: 1-6

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