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"Automatic inspection of solder joints using layered illumination."

Tae-Hyeon Kim et al. (1996)

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DOI: 10.1109/ICIP.1996.560960

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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  - conf/icip/KimCMP96
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  - https://dblp.org/rec/conf/icip/KimCMP96
Tae-Hyeon Kim, Tai-Hoon Cho, Young Shik Moon, Sung-Han Park:
Automatic inspection of solder joints using layered illumination. ICIP (2) 1996: 645-648

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