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"Neural netwok based X-ray tomography for fast inspection of apples on a ..."
Eline Janssens et al. (2015)
- Eline Janssens, Jan De Beenhouwer
, Mattias Van Dael, Pieter Verboven
, Bart M. Nicolaï, Jan Sijbers
:
Neural netwok based X-ray tomography for fast inspection of apples on a conveyor belt system. ICIP 2015: 917-921
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