"SEU Sensitivity of PMOS and NMOS Transistors in a 65 nm Bulk Process by ..."

Keita Yoshida et al. (2023)

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DOI: 10.1109/ICICDT59917.2023.10332287

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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Keita Yoshida, Ryuichi Nakajima, Shotaro Sugitani, Takafumi Ito, Jun Furuta, Kazutoshi Kobayashi:
SEU Sensitivity of PMOS and NMOS Transistors in a 65 nm Bulk Process by α-Particle Irradiation. ICICDT 2023: 72-75

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