"Assessing the Vulnerability of Time-Controlled Logic-Loop-Based Circuits ..."

Ziyang Ye, Makoto Ikeda (2023)

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DOI: 10.1109/ICICDT59917.2023.10332297

access: closed

type: Conference or Workshop Paper

metadata version: 2024-01-04

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Ziyang Ye, Makoto Ikeda:
Assessing the Vulnerability of Time-Controlled Logic-Loop-Based Circuits to Voltage Fault Injection and Power Monitoring Attacks. ICICDT 2023: 112-115

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