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"Design and process issues for high yield and reliability in thin BOX FD-SOI."

Yoshiki Yamamoto (2023)

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DOI: 10.1109/ICICDT59917.2023.10332299

access: closed

type: Conference or Workshop Paper

metadata version: 2024-01-04

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Yoshiki Yamamoto:
Design and process issues for high yield and reliability in thin BOX FD-SOI. ICICDT 2023: xxix

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