"Lifetime prediction of channel hot carrier degradation in pMOSFETs ..."

Yuichiro Mitani et al. (2012)

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DOI: 10.1109/ICICDT.2012.6232842

access: closed

type: Conference or Workshop Paper

metadata version: 2021-04-09

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Yuichiro Mitani, Shigeto Fukatsu, Daisuke Hagishima, Kazuya Matsuzawa:
Lifetime prediction of channel hot carrier degradation in pMOSFETs separating NBTI component. ICICDT 2012: 1-4

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