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"Random telegraph noise as a new measure of plasma-induced charging damage ..."

Masayuki Kamei et al. (2014)

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DOI: 10.1109/ICICDT.2014.6838598

access: closed

type: Conference or Workshop Paper

metadata version: 2017-06-04

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Masayuki Kamei, Yoshinori Takao, Koji Eriguchi, Kouichi Ono:
Random telegraph noise as a new measure of plasma-induced charging damage in MOSFETs. ICICDT 2014: 1-4

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