"Investigation of Low Temperature Noise and Current Fluctuation for ..."

Ran Cheng (2023)

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DOI: 10.1109/ICICDT59917.2023.10332279

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type: Conference or Workshop Paper

metadata version: 2024-01-04

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Ran Cheng:
Investigation of Low Temperature Noise and Current Fluctuation for Advanced Transistors: Characterization and Modeling. ICICDT 2023: xxvii

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