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"Fault Detection By Consumption Measurement in CMOS Circuits."

Mireille Jacomino, J. L. Rainard, Rene David (1987)

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DOI: 10.1007/978-3-642-45628-2_8

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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  dblp key:
  - conf/icftcs/JacominoRD87
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Mireille Jacomino, J. L. Rainard, Rene David:
Fault Detection By Consumption Measurement in CMOS Circuits. Fehlertolerierende Rechensysteme 1987: 83-94

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