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"Impact of dynamic voltage scaling and thermal factors on FinFET-based SRAM ..."
Felipe Rosa et al. (2015)
- Felipe Rosa, Raphael Martins Brum, Gilson I. Wirth, Luciano Ost, Ricardo Reis:
Impact of dynamic voltage scaling and thermal factors on FinFET-based SRAM reliability. ICECS 2015: 137-140
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