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"Analog fault detectability based on statistical circuit analysis."

Dimitrios K. Papakostas, V. C. Kosmidis, Alkiviades A. Hatzopoulos (1996)

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DOI: 10.1109/ICECS.1996.584607

access: closed

type: Conference or Workshop Paper

metadata version: 2021-02-09

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  dblp key:
  - conf/icecsys/PapakostasKH96
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  - https://dblp.org/rec/conf/icecsys/PapakostasKH96
Dimitrios K. Papakostas, V. C. Kosmidis, Alkiviades A. Hatzopoulos:
Analog fault detectability based on statistical circuit analysis. ICECS 1996: 1076-1079

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