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"Relation between MOSFET degradation and interface-states generation."

N. Guenifi, F. Djahli, A. Mayouf (2000)

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DOI: 10.1109/ICECS.2000.913030

access: closed

type: Conference or Workshop Paper

metadata version: 2021-01-20

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  - conf/icecsys/GuenifiDM00
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N. Guenifi, F. Djahli, A. Mayouf:
Relation between MOSFET degradation and interface-states generation. ICECS 2000: 936-939

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