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"Precise Positioning and Defect Detection of Semiconductor Chip Based on ..."

Xu Zhao et al. (2021)

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DOI: 10.1007/978-981-16-9247-5_35

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-07

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  dblp key:
  - conf/iccsip/ZhaoWLL21
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Xu Zhao, Yingjian Wang, Lianpeng Li, Fuchao Liu:
Precise Positioning and Defect Detection of Semiconductor Chip Based on Microvision. ICCSIP 2021: 451-462

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