Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"ESD Capability Analysis of High-voltage nLDMOSs by the Bulk Terminal ..."

Jhong-Yi Lai et al. (2022)

> Home

Details and statistics

DOI: 10.1109/ICCE-TAIWAN55306.2022.9869178

access: closed

type: Conference or Workshop Paper

metadata version: 2022-09-09

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/icce-tw/LaiCLMC22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/icce-tw/LaiCLMC22
Jhong-Yi Lai, Shen-Li Chen, Zhi-Wei Liu, Xing-Chen Mai, Yu-Jie Chung:
ESD Capability Analysis of High-voltage nLDMOSs by the Bulk Terminal Modulation. ICCE-TW 2022: 71-72

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.