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"Built-in Self-Test Circuits for All-digital Phase-Locked Loops."
Ching-Che Chung, Wei-Jung Chu, Yi-Ting Tsai (2019)
- Ching-Che Chung, Wei-Jung Chu, Yi-Ting Tsai:
Built-in Self-Test Circuits for All-digital Phase-Locked Loops. ICCE-TW 2019: 1-2
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